• DocumentCode
    1442786
  • Title

    A method for software reliability analysis and prediction application to the TROPICO-R switching system

  • Author

    Kanoun, Karama ; De Bastos Martini, Marta Rettelbusch ; De Souza, Jorge Moreira

  • Author_Institution
    LAAS-CNRS, Toulouse, France
  • Volume
    17
  • Issue
    4
  • fYear
    1991
  • fDate
    4/1/1991 12:00:00 AM
  • Firstpage
    334
  • Lastpage
    344
  • Abstract
    An evaluation method which allows existing reliability growth models to provide better predictions of software behavior is presented. The method is primarily based on the analysis of the trend exhibited by the data collected on the program (which is determined by reliability growth tests). Reliability data are then partitioned according to the trend, and two types of reliability growth models can be applied: when the data exhibit reliability decrease followed by reliability growth, an S-shaped model can be applied, and in case of reliability growth, most of the other existing reliability growth models can be applied. The hyperexponential model is shown to allow prediction of the software residual failure rate in operation, and this failure rate is used as a qualification index for the software product. The method is illustrated through its application to the Brazilian electronic switching system TROPICO-R
  • Keywords
    electronic switching systems; reliability theory; software reliability; Brazilian electronic switching system; S-shaped model; TROPICO-R switching system; hyperexponential model; prediction application; qualification index; reliability decrease; reliability growth; reliability growth models; software behavior; software reliability; software residual failure rate; Application software; Electronic switching systems; Failure analysis; Maintenance; Predictive models; Software development management; Software reliability; Software systems; Switching systems; Testing;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.90433
  • Filename
    90433