Comparison of time base nonlinearity measurement techniques

Author

Stenbakken, Gerard N. ; Deyst, John P.

Author_Institution

Dept. of Commerce, Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

47

Issue

1

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

34

Lastpage

39

Abstract

Distortions in the time bases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing time base distortion, using pure sine-wave inputs of known frequency: the “sinefit” and the “analytic signal” methods. Simulations are used to compare the performance of the two methods versus different types of time base distortion, different sine-wave frequencies, number of different sine-wave phases, levels of random noise, and levels of random jitter. The performance of the two methods varies considerably, dependent upon the input signal frequency and type of time base distortion. Each method does much better than the other for certain cases

Keywords

curve fitting; digital simulation; electric distortion measurement; electronic engineering computing; jitter; nonlinear distortion; random noise; time bases; waveform analysis; analytic signal; digitizers; equivalent-time oscilloscopes; nonlinearity measurement; performance; random jitter; random noise; simulation; sine-wave inputs; sinefit; time base distortion; waveforms distortion; Delay; Distortion measurement; Frequency; Jitter; Measurement techniques; Nonlinear distortion; Oscilloscopes; Phase distortion; Pulse generation; Sampling methods;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.728785

Filename

728785