A new method for estimating the aperture uncertainty of A/D converters

Author

Chiorboli, Giovanni ; Fontanili, Massimo ; Morandi, Carlo

Author_Institution

Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy

Volume

47

Issue

1

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

61

Lastpage

64

Abstract

Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. The proposed method solves the difficulties arising from quantization, and nonlinearity. The method estimates the noise distribution function by fine adjustment of the input signal offset. The contribution of jitter-induced voltage noise is separated from additive noise in two different ways. Finally, the aperture uncertainty, assumed independent of the frequency, is estimated by varying the signal frequency. Experimental results obtained on 8 and 10 bit converters are discussed

Keywords

analogue-digital conversion; electric noise measurement; measurement uncertainty; normal distribution; phase noise; quantisation (signal); random noise; signal sampling; timing jitter; A/D converters; additive noise; aperture uncertainty estimation method; converter nonlinearity; fine adjustment; input signal offset; jitter-induced voltage noise; noise distribution function; noise measurement; normal distribution; phase jitter; quantization; sampling jitter; test setup noise; timing jitter; varied signal frequency; Additive noise; Apertures; Frequency estimation; Jitter; Noise measurement; Quantization; Signal to noise ratio; Testing; Uncertainty; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.728790

Filename

728790