Title :
A new method for estimating the aperture uncertainty of A/D converters
Author :
Chiorboli, Giovanni ; Fontanili, Massimo ; Morandi, Carlo
Author_Institution :
Dipt. di Ingegneria dell´´Inf., Parma Univ., Italy
fDate :
2/1/1998 12:00:00 AM
Abstract :
Aperture uncertainty measurements are strongly influenced by quantization, converter nonlinearity and test setup noise. The proposed method solves the difficulties arising from quantization, and nonlinearity. The method estimates the noise distribution function by fine adjustment of the input signal offset. The contribution of jitter-induced voltage noise is separated from additive noise in two different ways. Finally, the aperture uncertainty, assumed independent of the frequency, is estimated by varying the signal frequency. Experimental results obtained on 8 and 10 bit converters are discussed
Keywords :
analogue-digital conversion; electric noise measurement; measurement uncertainty; normal distribution; phase noise; quantisation (signal); random noise; signal sampling; timing jitter; A/D converters; additive noise; aperture uncertainty estimation method; converter nonlinearity; fine adjustment; input signal offset; jitter-induced voltage noise; noise distribution function; noise measurement; normal distribution; phase jitter; quantization; sampling jitter; test setup noise; timing jitter; varied signal frequency; Additive noise; Apertures; Frequency estimation; Jitter; Noise measurement; Quantization; Signal to noise ratio; Testing; Uncertainty; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
