Title :
Embedded memory technologies: Present and future
Abstract :
This issue of D&T features seven articles on the future landscape of embedded memories. The articles address emerging memories and the unique challenges of nanoscale memory technologies.
Keywords :
MRAM; PCRAM; SRAM; STT-RAM; design and test; eDRAM; embedded memory; emerging memories;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.15
