DocumentCode
1443078
Title
Embedded memory technologies: Present and future
Volume
28
Issue
1
fYear
2011
Firstpage
4
Lastpage
4
Abstract
This issue of D&T features seven articles on the future landscape of embedded memories. The articles address emerging memories and the unique challenges of nanoscale memory technologies.
Keywords
MRAM; PCRAM; SRAM; STT-RAM; design and test; eDRAM; embedded memory; emerging memories;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2011.15
Filename
5708254
Link To Document