Title :
Guest editors´ introduction: Nanoscale Memories Pose Unique Challenges
Author :
Kim, Chris H. ; Chang, Leland
Author_Institution :
University of Minnesota
Abstract :
This special issue presents seven articles that examine the characteristics, capabilities, and challenges of various embedded memories, especially those designed in emerging technologies. The articles address the intricacies and trade-offs required by designers when faced with scaling and power constraints.
Keywords :
DRAM chips; Memory; Nanoscale devices; Random access memory; SRAM chips; Special issues and sections; DRAM; FeRAM; MRAM; PCRAM; SRAM; STT-RAM; design and test; eDRAM; embedded memories;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2011.21
