Title :
Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP
Author :
Cheng, Binjie ; Dideban, Daryoosh ; Moezi, Negin ; Millar, Campbell ; Roy, Gareth ; Wang, Xingsheng ; Roy, Scott ; Asenov, Asen
Author_Institution :
Univ. of Glasgow, Glasgow, UK
Abstract :
The strategy to generate statistical model parameters is essential for variability-aware design. Based on 3D atomistic simulation results, this article evaluates the accuracy of statistical parameter generation for two industry-standard compact device models.
Keywords :
circuit simulation; integrated circuit modelling; statistical analysis; 3D atomistic simulation; BSIM4; PSP; industry-standard compact device models; statistical model parameters; statistical parameter generation; statistical-variability compact-modeling strategy; variability-aware design; Circuit simulation; Collision mitigation; Computational modeling; Gaussian distribution; Integrated circuit modeling; MOSFETs; Nanoscale devices; Principal component analysis; Semiconductor device modeling; Testing; MOSFET; design and test; mismatch; statistical compact modeling; statistical variability;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2010.53
