DocumentCode :
1443501
Title :
´Tis the gift to be simple
Author :
Nassif, Sani R.
Author_Institution :
IBM Research—Austin
Volume :
27
Issue :
2
fYear :
2010
Firstpage :
84
Lastpage :
86
Abstract :
IC engineers rarely get to crash test their designs. Instead, they take pride in getting the design right the first time—no room for iterations and redesign. This is done by performing extensive computer simulations of designs. These simulations let engineers accurately predict the behavior of the design while it is still represented by computer data, before it ever becomes a real physical object.
Keywords :
Automotive engineering; CMOS technology; Computational modeling; Computer simulation; Design engineering; Laboratories; Predictive models; Semiconductor device modeling; US Department of Transportation; Vehicle crash testing; IC design; modeling; simulation;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2010.32
Filename :
5432330
Link To Document :
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