DocumentCode :
1443538
Title :
Effect of RFI on the error probabilities of synchronizer circuits
Author :
Li, Kam-Wing ; Zaky, Safwat G. ; Balmain, Keith G.
Author_Institution :
Northern Telecom Electron. Ltd., Ottawa, Ont., Canada
Volume :
45
Issue :
10
fYear :
1998
fDate :
10/1/1998 12:00:00 AM
Firstpage :
1052
Lastpage :
1061
Abstract :
This paper examines the ways in which radio frequency interference (RFI) affects the error probability of synchronizer circuits. Two effects are predicted analytically and demonstrated experimentally. In one case, RFI changes the effective sampling time of the synchronizer output. In the second, RFI affects the nonlinear input-output pulsewidth transfer characteristic of a logic chain causing the pulsewidth distribution at the synchronizer input to be modified. It is shown that RFI may increase or decrease the error probability of a synchronizer circuit depending on circuit parameters and on the point of injection of the RFI
Keywords :
error statistics; logic circuits; radiofrequency interference; synchronisation; RFI; error probability; logic chain; nonlinear transfer characteristics; pulsewidth distribution; radiofrequency interference; sampling time; synchronizer circuit; Digital systems; Electromagnetic interference; Error probability; Flip-flops; Frequency synchronization; Logic circuits; Logic gates; Metastasis; Radiofrequency interference; Space vector pulse width modulation;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.728859
Filename :
728859
Link To Document :
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