DocumentCode

1443878

Title

Author´s reply

Author

Lee, Kuan-Chou ; Hwu, Jenn-Gwo

Author_Institution

National Taiwan University

Volume

19

Issue

11

fYear

1998

Firstpage

448

Lastpage

449

Keywords

Apertures; Delay; Educational institutions; Error correction; Light sources; Measurement standards; Photovoltaic cells; Power measurement; Testing; Tungsten;

fLanguage

English

Journal_Title

Electron Device Letters, IEEE

Publisher

ieee

ISSN

0741-3106

Type

jour

DOI

10.1109/LED.1998.728910

Filename

728910