Remote sensing of layered media with non-Gaussian random rough interfaces full-wave approach

A full-wave approach is used to investigate electromagnetic scattering from three-media irregular-layered structures. The surface height of the rough interface is characterized by a family of gamma probability density functions (pdfs) of order K. For random rough surface heights characterized by one-sided pdfs, the thickness of the coating material can be chosen to be positive everywhere. When the rough surface heights are characterized by the familiar (two-sided) Gaussian pdf, convergence problems arise since a finite probability exists that the thickness of the coating is “negative”