• DocumentCode
    1444139
  • Title

    Thermal emission from a layered medium bounded by a slightly rough interface

  • Author

    Johnson, Joel T.

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    39
  • Issue
    2
  • fYear
    2001
  • fDate
    2/1/2001 12:00:00 AM
  • Firstpage
    368
  • Lastpage
    378
  • Abstract
    The small perturbation method (SPM) is applied to study thermal emission from a layered medium bounded by a slightly rough interface. Brightness temperatures are calculated to second order in surface height, including both specular reflection coefficient corrections and incoherent Bragg scatter terms. Unlike the homogeneous medium case, in which the SPM applied for emission predictions produces an expansion in surface slope, the theory remains a small height expansion, and convergence of the series is shown to depend on properties of the layered medium. Results from this theory can be applied in studies of soil moisture, sea ice, or sea surface remote sensing and buried object detection with microwave radiometers
  • Keywords
    buried object detection; geophysical techniques; hydrological techniques; moisture measurement; oceanographic techniques; radiometry; remote sensing; sea ice; soil; terrain mapping; brightness temperature; buried object detection; geophysical measurement technique; geothermal method; height expansion; hydrology; incoherent Bragg scatter; land surface; layered medium; microwave radiometry; ocean; remote sensing; rough interface; sea ice; sea surface; slightly rough interface; small perturbation method; soil moisture; specular reflection coefficient; terrain mapping; terrestrial heat; theory; thermal emission; Brightness temperature; Buried object detection; Ocean temperature; Perturbation methods; Reflection; Rough surfaces; Scanning probe microscopy; Scattering; Sea surface; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.905245
  • Filename
    905245