DocumentCode :
1444232
Title :
Analysis of SOI CMOS Microprocessor´s SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods
Author :
Gorbunov, Maxim S. ; Vasilegin, Boris V. ; Antonov, Andrey A. ; Osipenko, Pavel N. ; Zebrev, Gennady I. ; Anashin, Vasily S. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Useinov, Rustem G. ; Chumakov, Alexander I. ; Pechenkin, Alexander A. ; Yanenko
Author_Institution :
Computation Engineering Department (ORVT) of Scientific Research Institute of System Analysis, Russian Academy of Sciences, Moscow, Russia
Volume :
59
Issue :
4
fYear :
2012
Firstpage :
1130
Lastpage :
1135
Abstract :
The results on SEE sensitivity of 0.5 
m SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle accelerator, pulsed laser technique and 
Cf fission source) is provided for the cache. The possible sources of discrepancies between test results and the ways of data correction and methods of testing techniques\´ accuracy improvement are discussed.
Keywords :
Cache memory; Lasers; Logic gates; Microprocessors; Radiation effects; Registers; Sensitivity; CMOS; Cf-252; SEE; SEFI; SOI; heavy ions; laser; microprocessor;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2183147
Filename :
6148323
Link To Document :
