DocumentCode
1444363
Title
Anomalous behaviour of the dielectric spectroscopy response of nanocomposites
Author
Kochetov, Roman ; Andritsch, Thomas ; Morshuis, Peter H F ; Smit, Johan J.
Author_Institution
High Voltage & Manage. Group, Delft Univ. of Technol., Delft, Netherlands
Volume
19
Issue
1
fYear
2012
fDate
2/1/2012 12:00:00 AM
Firstpage
107
Lastpage
117
Abstract
A study on the dielectric spectroscopy of epoxy-based nanocomposites filled with different types of particles, such as Al2O3, AlN, MgO, SiO2 and BN, is presented. The surface of the nanoparticles was modified with a silane coupling agent, in order to make them compatible with the organic host and create a system with homogeneously dispersed filler material. Morphological characterizations of individual particles and fabricated composites were performed by means of transmission and scanning electron microscopy. The present research addresses an analysis of the complex permittivity. The relative permittivity of nanocomposites shows an unusual behaviour. Introduction of a low percentage of high permittivity filler results in a decrease of the permittivity of the bulk polymer material. We propose a qualitative explanation for the reduction of the relative permittivity, compared to the reference samples. The interface layer of surface modified particles plays a more important role than the nature of the particles themselves. The immobilization caused by the surface treatment of the nanoparticles seems to be the main factor determining the relative permittivity of the composites with fillgrade below 5 wt.%. The imaginary part of the complex permittivity, which represents the dielectric losses in the system, does not change significantly with addition of nanofiller up to 5 wt.%.
Keywords
III-V semiconductors; aluminium compounds; boron compounds; dielectric losses; dielectric materials; dielectric polarisation; filled polymers; nanocomposites; nanofabrication; nanoparticles; permittivity; resins; scanning electron microscopy; silicon compounds; surface treatment; transmission electron microscopy; wide band gap semiconductors; Al2O3; AlN; BN; MgO; bulk polymer material; complex permittivity; dielectric spectroscopy response; epoxy-based nanocomposite; fabricated composite; homogeneously dispersed filler material; morphological characterization; nanoparticle surface treatment; organic host; permittivity filler; relative permittivity; scanning electron microscopy; silane coupling agent; surface modified particle; transmission microscopy; Aluminum oxide; Dielectrics; Nanocomposites; Nanoparticles; Permittivity; Polymers; Surface treatment; Nanocomposite; dielectric spectroscopy; interface phenomena; relative permittivity; surface treatment;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2012.6148508
Filename
6148508
Link To Document