Title :
Wavelet analysis for estimation of mean-curve of impulse waveforms superimposed by noise, oscillations and overshoot
Author :
Satish, L. ; Gururaj, B.I.
Author_Institution :
High Voltage Inst., Finland
fDate :
1/1/2001 12:00:00 AM
Abstract :
This paper describes a novel approach to estimate the mean-curve of impulse voltage waveforms that are recorded during impulse tests. These waveforms in practice are superposed by noise, oscillations, and overshoot. The approach is based on multiresolution signal decomposition (a kind of wavelet transform) and has many advantages over existing methods, since it does not assume any model for estimating the mean-curve, is interactive in nature, suitable for full and chopped impulses, does not introduce distortions due to its application, is easy to implement and does not call for changes to existing standards. Results presented show its applicability
Keywords :
impulse testing; power apparatus; signal processing; wavelet transforms; IEC 60060-1; IEC 61083-2; digital processing; high voltage power apparatus testing; impulse tests; impulse waveforms; mean-curve estimation; multiresolution signal decomposition; noise; oscillations; overshoot; wavelet analysis; wavelet transform; Distortion; Filtering; Guidelines; IEC standards; Impulse testing; Insulation testing; Signal resolution; Voltage; Wavelet analysis; Wavelet transforms;
Journal_Title :
Power Delivery, IEEE Transactions on