Title :
Delay and current estimation in a CMOS inverter with an RC load
Author :
Hafed, Mohamed ; Oulmane, Mourad ; Rumin, Nicholas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
fDate :
1/1/2001 12:00:00 AM
Abstract :
A novel and efficient method is presented for computing the delay and supply current pulse in a CMOS inverter with an RC load. The method builds on existing techniques for computing these quantities in the presence of a capacitance load. As in the work of other authors, the concept of an effective capacitance Ceff is used. However, here it captures the inverter´s behavior only while the charging/discharging transistor is in saturation and, therefore, behaves like a current source to a good approximation. This capacitance is determined by means of a simple iterative procedure that uses an empirical piecewise-linear approximation to the RC circuit´s output voltage, which has a normal CMOS symmetrical form. Since a Ceff defined in the above way is independent of the inverter´s parameters, such as transistor size, the coefficients of the approximation have to be determined for only one reference inverter. A simple analytical method yields the inverter´s output voltage outside the saturation region. The complete model has been shown to be accurate for both 0.8-μm 5-V and 0.24-μm 2.5-V CMOS technologies. Its speed is comparable to that of the “capacitance load” techniques that it relies on
Keywords :
CMOS logic circuits; capacitance; delays; integrated circuit interconnections; iterative methods; logic gates; piecewise linear techniques; 0.24 micron; 0.8 micron; 2.5 V; 5 V; CMOS inverter; RC load; capacitance load; charging/discharging transistor; current estimation; delay; empirical piecewise-linear approximation; iterative procedure; output voltage; reference inverter; supply current pulse; transistor size; CMOS technology; Capacitance; Current supplies; Delay estimation; Integrated circuit interconnections; Life estimation; Logic gates; Pulse inverters; Semiconductor device modeling; Voltage;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on