DocumentCode
1444566
Title
Fault location in cutpoint cellular arrays
Author
Kodandapani, K.L. ; Swamy, M. E Sowmitri
Author_Institution
University of Regina, Department of Computer Science, Regina, Canada
Volume
123
Issue
6
fYear
1976
fDate
6/1/1976 12:00:00 AM
Firstpage
515
Lastpage
516
Abstract
A systematic procedure to locate a faulty cell in a column (row) of the main array (rotated array) in cutpoint cellular arrays is presented. It is assumed that a cell failure may be due to stuck-at faults at the input/output leads of the cell or due to stuck-at faults within the cell.
Keywords
cellular arrays; fault location; logic testing; cell failure; cutpoint cellular arrays; fault location;
fLanguage
English
Journal_Title
Electrical Engineers, Proceedings of the Institution of
Publisher
iet
ISSN
0020-3270
Type
jour
DOI
10.1049/piee.1976.0117
Filename
5253745
Link To Document