DocumentCode
1444584
Title
Analysis and generation of control and observation structures for analog circuits
Author
Wen, Yun-Che ; Lee, Kuen-Jong
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
20
Issue
1
fYear
2001
fDate
1/1/2001 12:00:00 AM
Firstpage
165
Lastpage
171
Abstract
Using control and observation structures (COSs) to enhance the testability of analog circuits has recently received much attention. However, previous methods for generating COS are rather ad hoc. In this paper, we present an algorithm that can systematically generate all possible COSs based on the user´s requirements. Extensive analysis on the common features, constraints, possible operations, and required number of switches and nodes for a COS has been carried out. Various kinds of matrices to represent the properties of COSs are defined. A compatibility checking method based on a transitive closure procedure is developed to identify the required COSs. Experimental results show that the algorithm can effectively generate all required COSs, including many COSs that are previously not identified
Keywords
analogue integrated circuits; controllability; design for testability; integrated circuit testing; observability; COSs; analog circuits; compatibility checking method; control and observation structures; switches; testability; transitive closure procedure; Analog circuits; Automatic speech recognition; Circuit testing; Controllability; Costs; Design for testability; Observability; Pins; Switches; Switching circuits;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.905684
Filename
905684
Link To Document