• DocumentCode
    1444584
  • Title

    Analysis and generation of control and observation structures for analog circuits

  • Author

    Wen, Yun-Che ; Lee, Kuen-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    20
  • Issue
    1
  • fYear
    2001
  • fDate
    1/1/2001 12:00:00 AM
  • Firstpage
    165
  • Lastpage
    171
  • Abstract
    Using control and observation structures (COSs) to enhance the testability of analog circuits has recently received much attention. However, previous methods for generating COS are rather ad hoc. In this paper, we present an algorithm that can systematically generate all possible COSs based on the user´s requirements. Extensive analysis on the common features, constraints, possible operations, and required number of switches and nodes for a COS has been carried out. Various kinds of matrices to represent the properties of COSs are defined. A compatibility checking method based on a transitive closure procedure is developed to identify the required COSs. Experimental results show that the algorithm can effectively generate all required COSs, including many COSs that are previously not identified
  • Keywords
    analogue integrated circuits; controllability; design for testability; integrated circuit testing; observability; COSs; analog circuits; compatibility checking method; control and observation structures; switches; testability; transitive closure procedure; Analog circuits; Automatic speech recognition; Circuit testing; Controllability; Costs; Design for testability; Observability; Pins; Switches; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.905684
  • Filename
    905684