Title :
Direct extraction of nonlinear FET I-V functions from time domain large signal measurements
Author :
Currás-Francos, M.C. ; Tasker, P.J. ; Fernandez-Barciela, M. ; Keefe, S. S O ; Campos-Roca, Y. ; Sanchez, E.
Author_Institution :
ETSI Telecomunicacion, Vigo Univ., Spain
fDate :
10/15/1998 12:00:00 AM
Abstract :
A simplified method for extracting two port nonlinear field effect transistor current sources from time domain microwave voltage and current waveform measurements is presented. This method is based on the use of an appropriate reflective load-pull termination to ensure that the output voltage is 180° out of phase with the input voltage
Keywords :
electric current measurement; microwave field effect transistors; microwave measurement; semiconductor device models; semiconductor device testing; voltage measurement; direct extraction; field effect transistor current sources; microwave current waveform measurement; microwave voltage waveform measurements; nonlinear FET I-V functions; reflective load-pull termination; time domain large signal measurements; two port nonlinear FET current sources;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981449
