DocumentCode :
1444964
Title :
Reversible Transverse Stress Effects on the Critical Current of an Internal Tin {\\rm Nb}_{3}{\\rm Sn} Strand Under Axial Strain
Author :
Oh, Sangjun ; Park, Soo-Hyeon ; Lee, Chulhee ; Choi, Heekyung ; Park, Wonwoo ; Kim, Keeman
Author_Institution :
Nat. Fusion Res. Inst., Daejeon, South Korea
Volume :
20
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1451
Lastpage :
1454
Abstract :
We have developed an apparatus to investigate the effect of transverse stress under axial strain on the critical current of superconducting strands. An internal tin Nb3Sn wire is soldered on a C-shape ring (called Pacman) made of 2% beryllium doped copper alloy and axial strain from -0.7 to 0.7% can be applied. The actual strain on a sample was estimated from a comparison with the critical current measurement results using a Walter spiral probe. Reversible transverse stress effects on the critical current were studied in this work and the transverse pressure was applied up to 40 MPa under ??0.5% axial strain. The critical current was initially increased about 3% as transverse load was applied and then decreased almost linearly under compressive axial strain. Similar behavior is observed under tensile axial strain but the critical current decreases rather sharply at higher load. A unified description based on 3 dimensional deviatoric strain was difficult for the sample studied in this work.
Keywords :
compressive strength; critical currents; flux pinning; superconducting materials; tensile strength; Cu:Be; Nb3Sn; Nb3Sn wire; Walter spiral probe; beryllium doped copper alloy; compressive axial strain; critical current; internal tin strand; reversible transverse stress effects; tensile axial strain; transverse pressure; Deviatoric strain; internal tin ${rm Nb}_{3}{rm Sn}$; scaling law for flux pinning; strain dependence of the critical current; transverse stress effects;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2041538
Filename :
5433236
Link To Document :
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