DocumentCode
1444991
Title
Experimental verification of the link between timing jitter and phase noise
Author
Samori, C. ; Lacaita, A.L. ; Zanchi, A. ; Pizzolato, F.
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
Volume
34
Issue
21
fYear
1998
fDate
10/15/1998 12:00:00 AM
Firstpage
2024
Lastpage
2025
Abstract
A simple and intuitive derivation is presented of the relationship between the single sideband to carrier ratio and the timing jitter of the period of an oscillator. This link is then experimentally verified using a CMOS ring oscillator. The timing jitter of the period was measured with a time to amplitude converter
Keywords
CMOS integrated circuits; circuit noise; jitter; oscillators; phase noise; timing; CMOS ring oscillator; SSCR performance; experimental verification; jitter period measurement; phase noise; single sideband to carrier ratio; time to amplitude converter; timing jitter;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981419
Filename
729880
Link To Document