DocumentCode
1445811
Title
A New AMOLED Pixel Circuit With Pulsed Drive and Reverse Bias to Alleviate OLED Degradation
Author
Lee, Kuei-Yu ; Chao, Paul C -P
Author_Institution
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
59
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
1123
Lastpage
1130
Abstract
This paper proposes a new pixel circuit for an active matrix organic light-emitting diode (OLED) display, which consists of five thin-film transistors (TFTs) and one capacitor. This circuit develops techniques of pulsed drive and reverse bias to achieve desired emitted brightness levels and elongate OLED life times, respectively. A current mirror is also adopted in the circuit to minimize emission nonuniformity of the OLED panel. The required input data voltages for varied displayed gray levels are calculated based on analytically known TFT and OLED models and the designed circuit architecture. The designed pixel circuit is simulated with realistic TFT models for validating expected performance to realize 256 gray levels and minimizing nonuniformity. The designed circuit is implemented in a 2.4-in quarter video graphics array panel, which shows favorable performance for minimizing display nonuniformity and alleviating OLED degradation. In addition, a closeness is clearly observed among analytical predictions, simulations, and experimental measurements.
Keywords
LED displays; organic light emitting diodes; thin film transistors; AMOLED pixel circuit; OLED degradation; active matrix organic light-emitting diode; brightness levels; display nonuniformity; pulsed drive; reverse bias; size 2.4 in; thin-film transistors; video graphics array panel; Active matrix organic light emitting diodes; Capacitors; Degradation; Integrated circuit modeling; Logic gates; Thin film transistors; Active matrix organic light-emitting diode (AMOLED); OLED degradation; pulsed drive; reverse bias; thin-film transistors (TFTs); threshold compensation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2184289
Filename
6151084
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