• DocumentCode
    1445811
  • Title

    A New AMOLED Pixel Circuit With Pulsed Drive and Reverse Bias to Alleviate OLED Degradation

  • Author

    Lee, Kuei-Yu ; Chao, Paul C -P

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    1123
  • Lastpage
    1130
  • Abstract
    This paper proposes a new pixel circuit for an active matrix organic light-emitting diode (OLED) display, which consists of five thin-film transistors (TFTs) and one capacitor. This circuit develops techniques of pulsed drive and reverse bias to achieve desired emitted brightness levels and elongate OLED life times, respectively. A current mirror is also adopted in the circuit to minimize emission nonuniformity of the OLED panel. The required input data voltages for varied displayed gray levels are calculated based on analytically known TFT and OLED models and the designed circuit architecture. The designed pixel circuit is simulated with realistic TFT models for validating expected performance to realize 256 gray levels and minimizing nonuniformity. The designed circuit is implemented in a 2.4-in quarter video graphics array panel, which shows favorable performance for minimizing display nonuniformity and alleviating OLED degradation. In addition, a closeness is clearly observed among analytical predictions, simulations, and experimental measurements.
  • Keywords
    LED displays; organic light emitting diodes; thin film transistors; AMOLED pixel circuit; OLED degradation; active matrix organic light-emitting diode; brightness levels; display nonuniformity; pulsed drive; reverse bias; size 2.4 in; thin-film transistors; video graphics array panel; Active matrix organic light emitting diodes; Capacitors; Degradation; Integrated circuit modeling; Logic gates; Thin film transistors; Active matrix organic light-emitting diode (AMOLED); OLED degradation; pulsed drive; reverse bias; thin-film transistors (TFTs); threshold compensation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2184289
  • Filename
    6151084