Single electron fault modelling in quantum binary wire

Quantum cellular automata (QCA) represents an emerging technology at the nanotechnology level. There are various faults that may occur in QCA cells. One of these faults is the single electron fault that can happen during manufacturing or the operation of QCA circuits. The behaviour of the single electron fault in QCA devices is not similar to either previously investigated faults or conventional CMOS logic. A detailed simulation-based logic level modelling of the single electron fault for QCA binary wire is represented in this study. Results show that if a single electron fault occurs in a binary wire, then the logic value of that wire will be inverted.