DocumentCode :
1446002
Title :
Accurate and Analytical Statistical Spatial Correlation Modeling Based on Singular Value Decomposition for VLSI DFM Applications
Author :
Liu, Jui-Hsiang ; Tsai, Ming-Feng ; Chen, Lumdo ; Chen, Charlie Chung-Ping
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
29
Issue :
4
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
580
Lastpage :
589
Abstract :
With the significant advancement of statistical timing and yield analysis algorithms, there is a strong need for accurate and analytical spatial correlation models. In this paper, we propose a novel spatial correlation modeling method that can not only capture the general spatial correlation relationship but also can generate highly accurate and analytical models. Our method, based on singular value decomposition, can generate sequences of polynomial weighted by the singular values. Experimental results from foundry measurement data show that our proposed approach is 3x accuracy improvement over several distance based spatial correlation modeling methods.
Keywords :
VLSI; singular value decomposition; statistical analysis; VLSI DFM applications; foundry measurement; singular value decomposition; statistical spatial correlation modeling; statistical timing; very large scale integration; yield analysis algorithm; Algorithm design and analysis; Analytical models; Design for manufacture; Foundries; Integrated circuit technology; Semiconductor process modeling; Singular value decomposition; Threshold voltage; Timing; Very large scale integration; Process variation; SVD; spatial correlation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2042890
Filename :
5433751
Link To Document :
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