• DocumentCode
    1446083
  • Title

    A Real-Time Visual Inspection System for Discrete Surface Defects of Rail Heads

  • Author

    Li, Qingyong ; Ren, Shengwei

  • Author_Institution
    Sch. of Comput. & Inf. Technol., Beijing Jiaotong Univ., Beijing, China
  • Volume
    61
  • Issue
    8
  • fYear
    2012
  • Firstpage
    2189
  • Lastpage
    2199
  • Abstract
    Discrete surface defects impact the riding quality and safety of a railway system. However, it is a challenge to inspect such defects in a vision system because of illumination inequality and the variation of reflection property of rail surfaces. This paper puts forward a real-time visual inspection system (VIS) for discrete surface defects. VIS first acquires a rail image by the image acquisition system, and then, it cuts the subimage of rail track by the track extraction algorithm. Subsequently, VIS enhances the contrast of the rail image using the local normalization (LN) method, which is nonlinear and illumination independent. At last, VIS detects defects using the defect localization based on projection profile (DLBP), which is robust to noise and very fast. Our experimental results demonstrate that VIS detects the Type-II defects with a recall of 93.10% and Type-I defects with a recall of 80.41%, and the proposed LN method and DLBP algorithm are better than the related well-established approaches. Furthermore, VIS is very fast with a linear computational time complexity, and it can be in real time to run on a 216-km/h test train under our experimental setup.
  • Keywords
    computational complexity; image processing; inspection; railway safety; DLBP; LN method; VIS; defect localization; discrete surface defects; illumination inequality; image acquisition system; linear computational time complexity; local normalization method; projection profile; rail heads; railway system; real-time visual inspection system; track extraction algorithm; Head; Inspection; Lighting; Rails; Rough surfaces; Surface roughness; Visualization; Discrete surface defects; local normalization (LN); projection profile; visual inspection;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2012.2184959
  • Filename
    6151140