DocumentCode
1446173
Title
Correspondence
Volume
48
Issue
3
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
609
Lastpage
610
Keywords
Biographies; Educational institutions; Electrical engineering; Equations; Error correction; Hot carrier effects; MOS devices; Physics; Quantization; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2001.906459
Filename
906459
Link To Document