DocumentCode :
1446741
Title :
Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch
Author :
Bastani, Pouria ; Callegari, Nicholas ; Wang, Li.-C. ; Abadir, Magdy S.
Volume :
27
Issue :
3
fYear :
2010
Firstpage :
42
Lastpage :
53
Abstract :
For sub-65-nm design, many timing effects, if not explicitly and accurately modeled and simulated, can result in an unexpected timing mismatch between simulated and observed timing behavior on silicon chips. We describe a feature-ranking methodology to analyze and rank potential design-related issues, explaining how diverse features can be used to encode the potential design issues and how features can be interpreted properly.
Keywords :
elemental semiconductors; integrated circuit design; silicon; Si; design-silicon timing mismatch diagnosis; feature-ranking methodology; rank potential design; design and test; statistical diagnosis; statistical learning; timing mismatch;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2009.95
Filename :
5255200
Link To Document :
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