Title :
Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch
Author :
Bastani, Pouria ; Callegari, Nicholas ; Wang, Li.-C. ; Abadir, Magdy S.
Abstract :
For sub-65-nm design, many timing effects, if not explicitly and accurately modeled and simulated, can result in an unexpected timing mismatch between simulated and observed timing behavior on silicon chips. We describe a feature-ranking methodology to analyze and rank potential design-related issues, explaining how diverse features can be used to encode the potential design issues and how features can be interpreted properly.
Keywords :
elemental semiconductors; integrated circuit design; silicon; Si; design-silicon timing mismatch diagnosis; feature-ranking methodology; rank potential design; design and test; statistical diagnosis; statistical learning; timing mismatch;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.95