Title :
Asymmetric dithering technique for bias condition monitoring in optical QPSK modulator
Author :
Kawakami, H. ; Yoshida, Erika ; Miyamoto, Yutaka
Author_Institution :
NTT Network Innovation Labs., NTT Corp., Yokosuka, Japan
Abstract :
A simple and highly sensitive bias condition monitoring circuit is presented for optical quadrature phase shift keying (QPSK) modulators. The proposed asymmetric dithering technique is shown to be capable of monitoring three bias states simultaneously. The dithering penalty is shown to be less than 0.2 dB.
Keywords :
optical modulation; quadrature phase shift keying; asymmetric dithering technique; bias condition monitoring circuit; optical QPSK modulator; quadrature phase shift keying;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.3328
