Relaxation time and thermal stability in magneto-optical recording media

Author

Sbiaa, Rachid ; Mochida, Mitsunori ; Itoh, Yusuke ; Suzuki, Takao

Author_Institution

Toyota Technol. Inst., Nagoya, Japan

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2279

Lastpage

2281

Abstract

The time dependence of the magnetization process in amorphous TbFeCo thin films and (TbFeCo/Pt) multilayers is studied. By assuming a Gaussian distribution of relaxation times for magnetic aftereffect, the non-Arrhenius behavior of the magnetization decay is found in almost all samples. From a fitting of experimental data one can determine the mean value of relaxation time τ₀ and also its width Δτ₀. The multilayers of TbFeCo/Pt show a high stability compared to single layers of TbFeCo with also a small activation volume

Keywords

Gaussian distribution; amorphous magnetic materials; cobalt alloys; iron alloys; magnetic aftereffect; magnetic multilayers; magnetic thin films; magnetisation reversal; magneto-optical recording; remanence; sputtered coatings; terbium alloys; thermal stability; Gaussian distribution; TbFeCo; TbFeCo-Pt; amorphous thin films; isothermal remanence; magnetic aftereffect; magnetic viscosity; magnetization decay; magnetization process; magnetization reversal; magneto-optical recording media; multilayers; non-Arrhenius behavior; relaxation time; small activation volume; sputtered films; thermal stability; time dependence; Amorphous magnetic materials; Magnetic anisotropy; Magnetic field measurement; Magnetic multilayers; Magnetic recording; Magnetization; Magnetooptic recording; Perpendicular magnetic anisotropy; Thermal stability; Viscosity;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908393

Filename

908393