• DocumentCode
    1447255
  • Title

    A Fault-Tolerant Interconnect Mechanism for NMR Nanoarchitectures

  • Author

    Namazi, Ali ; Nourani, Mehrdad ; Saquib, Mohammad

  • Author_Institution
    Electr. Eng. Dept., Univ. of Texas at Dallas, Richardson, TX, USA
  • Volume
    18
  • Issue
    10
  • fYear
    2010
  • Firstpage
    1433
  • Lastpage
    1446
  • Abstract
    Redundancy techniques, such as N -tuple modular redundancy (NMR), has been widely used to correct faulty behavior of components and achieve high reliability. Almost all redundancy-based strategies rely on a majority voting. The voter, therefore, becomes a critical unit for the correct operation of any NMR system. In this paper, we propose a voterless fault-tolerant strategy to implement a robust NMR system design. We show that using a novel fault-tolerant communication mechanism, namely logic code division multiple access, we can transfer data with extremely low error rates among N modules and completely eliminate the need for a centralized voter unit. Such a highly reliable strategy is vital for future nanosystems in which high defect rate is expected. Experimental results are also reported to verify the concept, clarify the design procedure, and measure the system´s reliability.
  • Keywords
    code division multiple access; fault tolerant computing; integrated circuit interconnections; redundancy; N-tuple modular redundancy; NMR nanoarchitectures; centralized voter unit; data transfer; error rates; fault tolerant communication mechanism; fault tolerant interconnect mechanism; logic code division multiple access; voterless fault tolerant strategy; Error analysis; Fault tolerance; Fault tolerant systems; Logic; Multiaccess communication; Nuclear magnetic resonance; Redundancy; Reliability; Robustness; Voting; $N$-tuple modular redundancy (NMR); Code division multiple access (CDMA); communication grid; fault-tolerance; nanometer VLSI; on-chip interconnect; triple module redundancy (TMR); voter;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2024779
  • Filename
    5256143