DocumentCode :
1447421
Title :
Correlation of stress and magnetic anisotropy in CoCrPt/Cr films grown on textured substrates
Author :
Twisselmann, Douglas J. ; Shine, Yuh-Jer ; Ross, C.A.
Author_Institution :
MIT, Cambridge, MA, USA
Volume :
36
Issue :
5
fYear :
2000
fDate :
9/1/2000 12:00:00 AM
Firstpage :
2324
Lastpage :
2326
Abstract :
Stress in Cr and CoCrPt/Cr films grown on smooth and lithographically textured silicon substrates were studied to investigate the origins of magnetic anisotropy in grooved longitudinal magnetic recording media. Crystallographic texture changes from Cr(110) to Cr(200) orientations are correlated with large stress changes. Magnetostrictive effects due to stress anisotropy in grooved samples are explored.
Keywords :
chromium; chromium alloys; cobalt alloys; ferromagnetic materials; interface magnetism; internal stresses; magnetic anisotropy; magnetic recording; magnetic thin films; magnetostriction; platinum alloys; surface texture; CoCrPt-Cr; CoCrPt/Cr films; Cr; crystallographic texture; grooved longitudinal magnetic recording media; grooved samples; lithographically textured silicon substrates; magnetic anisotropy; magnetostrictive effects; smooth silicon substrates; stress; stress anisotropy; textured substrates; Chromium; Crystallography; Magnetic anisotropy; Magnetic films; Magnetic recording; Magnetostriction; Perpendicular magnetic anisotropy; Semiconductor films; Silicon; Stress;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.908417
Filename :
908417
Link To Document :
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