Title :
Novel quantitative MFM technique to study orientation ratio in longitudinal recording media
Author :
Yen, E.T. ; Thomson, T. ; Chen, J.-P. ; Richter, H.J. ; Ranjan, R.Y. ; Rauch, G.C.
Author_Institution :
Seagate Technol. Inc., Fremont, CA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
A quantitative MFM technique to determine the magnetic orientation in longitudinal media at the microscopic level is described. The remanent magnetization orientation ratio measured by this MFM technique correlates well with the orientation ratio measured using a VSM. The analysis used to determine the orientation ratio from MFM images is based on the disorder noise model. The experimental results show that orientation is reflected in medium noise and interaction effects, as measured using the delta M technique
Keywords :
magnetic force microscopy; magnetic recording noise; remanence; delta M technique; disorder noise model; interaction effects; longitudinal media; longitudinal recording media; magnetic orientation; medium noise; microscopic level; orientation ratio; quantitative MFM technique; remanent magnetization orientation ratio; Magnetic anisotropy; Magnetic force microscopy; Magnetic noise; Magnetic properties; Magnetic recording; Perpendicular magnetic anisotropy; Saturation magnetization; Transfer functions; Transistors; Transmission electron microscopy;
Journal_Title :
Magnetics, IEEE Transactions on
