Title :
Magnetic properties of nanostructured CoPt and FePt thin films
Author :
Jeong, Sangki ; Hsu, Yu-Nu ; Laughlin, David E. ; McHenry, Michael E.
Author_Institution :
Mater. Sci. & Eng. Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
Polycrystalline MgO underlayer films lead to different preferred orientations of L10 CoPt and FePt films after the annealing process, depending on the thickness of the L10 films. L10 films with a thickness greater than 20 nm revealed mostly L10 [100] fiber texture and consequently in-plane anisotropy as determined by magnetic hysteresis. Strong perpendicular anisotropy due to the L10 [001] fiber texture was obtained for thicknesses below 10 nm. The δM curve showed strong intergranular exchange coupling. The angular variation of coercivity showed the possibility of both domain wall motion and a rotational mechanism of magnetization reversal
Keywords :
annealing; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; iron alloys; magnesium compounds; magnetic anisotropy; magnetic domain walls; magnetic hysteresis; magnetic thin films; magnetisation reversal; nanostructured materials; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; surface texture; 10 to 20 nm; CoPt; FePt; L10 [001] fiber texture; L10 [100] fiber texture; MgO; annealing process; coercivity; domain wall motion; in-plane anisotropy; intergranular exchange coupling; magnetic hysteresis; magnetic properties; magnetization reversal; nanostructured CoPt thin films; nanostructured FePt thin films; polycrystalline MgO underlayer films; preferred orientation; rotational mechanism; strong perpendicular anisotropy; thickness; Anisotropic magnetoresistance; Magnetic films; Magnetic properties; Magnetization reversal; Perpendicular magnetic recording; Rapid thermal annealing; Reflection; Sputtering; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
