Modeling of misfit induced defects in Co/Cr recording media

Author

Wong, Bunsen Y. ; Ying, Ji Feng ; Johnson, Ken

Author_Institution

Phasemetrics Inc., San Diego, CA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2360

Lastpage

2362

Abstract

A 2D model to study the effect of crystal orientation on interfacial structural misfit and Co grain defect density for hcp Co/bcc Cr thin film system has been introduced. The magnitude of misfit depends strongly on the Co/Cr orientation, their respective lattice parameters, the grain size and to a lesser extend, the relative lattice orientation across the interface. However, the modeling results showed that by introducing lattice defects such as fcc stacking faults and misfit dislocations in the Co layer, one can greatly reduce this misfit and relax the interface

Keywords

chromium; cobalt; crystal orientation; dislocations; grain size; interface structure; lattice constants; magnetic recording; magnetic thin films; stacking faults; 2D model; Co; Co grain defect density; Co/Cr recording media; Cr; FCC stacking faults; crystal orientation; grain size; interfacial structural misfit; lattice defects; lattice parameters; misfit dislocations; misfit induced defects; modeling; relative lattice orientation; Chromium; Crystallization; Crystallography; Grain size; Lattices; Magnetic films; Magnetic properties; Magnetic recording; Stacking; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908430

Filename

908430