DocumentCode :
1447680
Title :
Analysis of errors in transient disturbance measurements using high-pass probes
Author :
Forti, Mauro M. ; Millanta, Luigi M.
Author_Institution :
Dept. of Electron. Eng., Florence Univ., Italy
Volume :
32
Issue :
3
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
205
Lastpage :
216
Abstract :
Transients are measured using a wide variety of devices with a known transfer function (voltage probes, current probes, baluns) to couple a disturbed conductor to the measuring apparatus. Most measuring devices are shown to be accurately represented by a single analytical model consisting of a first-order or second-order high-pass network, thus permitting accurate analytical and numerical determination of the output waveform for the more interesting input waveforms, i.e. unidirectional transients (double exponentials) or ringing transients (damped sines and cosines). The distortion at the output results in errors of the more common parameters used to specify the disturbances, namely, peak value, average rate of rise, integral of the squared voltage, impulse strength, and undershoot. These parameters are computed and shown in graphical form. Simplified asymptotic treatment is also offered for the determination of the output waveshape for early times and late times.
Keywords :
electric noise measurement; error analysis; measurement errors; probes; transfer functions; transients; average rate of rise; baluns; current probes; damped cosines; damped sines; disturbed conductor; double exponentials; early times; error analysis; first order high pass network; high-pass probes; impulse strength; input waveforms; late times; measuring apparatus; measuring devices; output waveform; peak value; ringing transients; second-order high-pass network; squared voltage integral; transfer function; transient disturbance measurements; undershoot; unidirectional transients; voltage probes; Current measurement; Cutoff frequency; Error analysis; Frequency domain analysis; Impedance matching; Probes; Time domain analysis; Transfer functions; Transient analysis; Voltage;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.57114
Filename :
57114
Link To Document :
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