Title :
Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads
Author :
Sharma, Nirupama ; Rea, Chris ; O´Kane, William
Author_Institution :
Seagate Technol. Ireland, Springtown, UK
fDate :
9/1/2000 12:00:00 AM
Abstract :
The dependence of CoPt stabilization properties on surface topography and seedlayer thickness has been investigated. The coercivity degrades drastically without a Cr seed, showing a dependence upon surface angle. Using the resulting data wafer level sensor structures are micromagnetic simulated. Poor seedlayer coverage on the junction edge yields open transfer curve loops and degraded sensor response
Keywords :
cobalt alloys; magnetic heads; magnetoresistive devices; permanent magnets; platinum alloys; surface topography; CoPt; degraded sensor response; junction edge; junction geometry; magnetoresistive heads; micromagnetic simulation; open transfer curve loops; permanent magnet stabilization; seedlayer geometry; surface angle; surface topography; wafer level sensor structures; Anisotropic magnetoresistance; Coercive force; Geometry; Magnetic films; Magnetic heads; Magnetic properties; Magnetic sensors; Permanent magnets; Substrates; Surface topography;
Journal_Title :
Magnetics, IEEE Transactions on
