Title :
Self-Assembled In-Plane Gate Oxide-Based Homojunction Thin-Film Transistors
Author :
Jiang, Jie ; Sun, Jia ; Zhou, Bin ; Lu, Aixia ; Wan, Qing
Author_Institution :
Ningbo Inst. of Mater. Technol. & Eng., Chinese Acad. of Sci., Ningbo, China
fDate :
4/1/2011 12:00:00 AM
Abstract :
In-plane gate homojunction thin-film transistors (TFTs) with patterned channel are self-assembled on SiO2-based solid electrolytes with only one nickel shadow mask. All indium-tin oxide channel and electrodes (source, drain, and gate) are deposited simultaneously by one-step magnetron sputtering, and no alignment is necessary. Such TFTs exhibited a good performance with a low operation voltage of 2.0 V, a large field-effect mobility of 28.7 cm2/V·s, a low subthreshold swing of 125 mV/decade, and a large on-off ratio of 1.3 × 106, respectively. A two-serial-capacitor model for the low-voltage operation mechanism is proposed and discussed.
Keywords :
capacitors; iodine compounds; silicon compounds; sputtering; thin film transistors; tin compounds; ITO; SiO2; electrodes; field-effect mobility; in-plane gate oxide-based homojunction thin-film transistors; low-voltage operation mechanism; one-step magnetron sputtering; patterned channel; self-assembled-based solid electrolytes; shadow mask; two-serial-capacitor model; voltage 2 V; Capacitance; Electrodes; Indium tin oxide; Logic gates; Solids; Thin film transistors; $ hbox{SiO}_{2}$-based solid electrolyte; Electric double layer (EDL); homojunction; in-plane gate thin-film transistors (TFTs); low voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2010.2104133