Title :
Two new measurement methods for explicit determination of complex permittivity
Author :
Wan, Changhua ; Nauwelaers, Bart ; De Raedt, Walter ; Van Rossum, Marc
fDate :
11/1/1998 12:00:00 AM
Abstract :
This paper presents two new measurement methods for explicit determination of complex permittivity. For the first time, these methods combine the explicit algorithm with a simplified yet accurate error-correction technique. The combination is made possible by the use of one sample of single length and another of double length. For low-loss materials, one of the methods is valid for any sample length and independent of sample positions, but needs a prior estimate of the permittivity, while the other requires no such estimate, but avoidance of the single length being multiples of half-wavelength in the sample. For high-loss materials, both methods may need the estimate. Advantages of each method can be taken if both methods are used simultaneously. Experimental results from the proposed methods show excellent agreement with those from a recent iterative method. Errors arising from small deviations from the double length are also analyzed and presented. The validity, explicitness, and simple error-correction capability make the new methods very useful
Keywords :
S-parameters; calibration; error analysis; error correction; measurement errors; microwave measurement; permittivity measurement; complex permittivity; error-correction technique; explicit algorithm; high-loss materials; low-loss materials; measurement methods; Calibration; Error correction; Humans; Iterative methods; Permeability; Permittivity measurement; Physics; Reflection; Scattering parameters; Transmission line measurements;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on