Title :
Characterization of magnetic stability in spin valve test devices
Author_Institution :
Seagate Technol., Bloomington, MN, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
In a simple spin valve device, electrical current parallel to the layers generates magnetic fields in opposite directions in the free and reference (or pinned) layers. We exploit this to distinguish between the free layer and the pinned layer as the location of common two-state magnetic instabilities. In addition, we demonstrate a method for determining both the direction and magnitude of the difference in magnetization between the two states by varying applied field direction
Keywords :
giant magnetoresistance; magnetic domains; magnetic heads; random noise; spin valves; GMR heads; applied field direction; electrical current; free layer; magnetic stability; magnetization; pinned layers; spin valve test devices; Electrical resistance measurement; Geometry; Magnetic devices; Magnetic domains; Magnetic field measurement; Magnetic fields; Magnetic heads; Spin valves; Stability; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
