A Comprehensive Mixed-Mode Time-Domain Load- and Source-Pull Measurement System

We present a novel test set devised for nonlinear balanced device characterization using load-pull techniques. The system is capable of measuring the voltage and current waveforms at the calibration reference planes while independently tuning the device under test (DUT) source and load differential- and common-mode terminations. The test set is designed to address present and future large-signal multiport measurement needs, easing the characterization task while developing new multiport active devices.