Title :
On linear dependencies in subspaces of LFSR-generated sequences
Author :
Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
fDate :
10/1/1996 12:00:00 AM
Abstract :
The probability of linear dependency in subsequences generated by linear feedback shift registers is examined. It is shown that this probability for a short subsequence, e.g., a sequence defined by the length of a scan chain, can be much higher than that for an entire m-sequence
Keywords :
binary sequences; built-in self test; logic testing; polynomials; probability; shift registers; linear dependency probability; linear feedback shift registers; m-sequence; scan chain; short subsequence probability; subsequences; Automatic testing; Built-in self-test; Circuit faults; Computer graphics; Equations; Linear feedback shift registers; Polynomials; System testing; Test pattern generators; Vectors;
Journal_Title :
Computers, IEEE Transactions on
