DocumentCode :
1448281
Title :
Microwave noise parameters of pseudomorphic GaInAs HEMTs under optical illumination
Author :
Escotte, L. ; Grenier, K. ; Tartarin, J.G. ; Graffeuil, J.
Author_Institution :
Univ. Paul Sabatier, Toulouse, France
Volume :
46
Issue :
11
fYear :
1998
fDate :
11/1/1998 12:00:00 AM
Firstpage :
1788
Lastpage :
1789
Abstract :
The microwave behavior of pseudomorphic high electron-mobility transistors (pHEMTs) under optical illumination is investigated in this paper. The influence of light on the small-signal equivalent circuit is derived from scattering-parameter measurements. The evolution of the noise parameters versus gate-to-source voltage and their sensibility to illumination is also demonstrated
Keywords :
III-V semiconductors; S-parameters; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; microwave field effect transistors; semiconductor device noise; GaInAs; diffusion noise; gate-to-source voltage; microwave noise parameters; optical control; optical illumination; pseudomorphic HEMT; scattering-parameter measurements; small-signal equivalent circuit; Circuit noise; Equivalent circuits; HEMTs; Lighting; MODFETs; Microwave transistors; Optical noise; Optical scattering; Optical sensors; PHEMTs;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.734581
Filename :
734581
Link To Document :
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