• DocumentCode
    1448281
  • Title

    Microwave noise parameters of pseudomorphic GaInAs HEMTs under optical illumination

  • Author

    Escotte, L. ; Grenier, K. ; Tartarin, J.G. ; Graffeuil, J.

  • Author_Institution
    Univ. Paul Sabatier, Toulouse, France
  • Volume
    46
  • Issue
    11
  • fYear
    1998
  • fDate
    11/1/1998 12:00:00 AM
  • Firstpage
    1788
  • Lastpage
    1789
  • Abstract
    The microwave behavior of pseudomorphic high electron-mobility transistors (pHEMTs) under optical illumination is investigated in this paper. The influence of light on the small-signal equivalent circuit is derived from scattering-parameter measurements. The evolution of the noise parameters versus gate-to-source voltage and their sensibility to illumination is also demonstrated
  • Keywords
    III-V semiconductors; S-parameters; equivalent circuits; gallium arsenide; high electron mobility transistors; indium compounds; microwave field effect transistors; semiconductor device noise; GaInAs; diffusion noise; gate-to-source voltage; microwave noise parameters; optical control; optical illumination; pseudomorphic HEMT; scattering-parameter measurements; small-signal equivalent circuit; Circuit noise; Equivalent circuits; HEMTs; Lighting; MODFETs; Microwave transistors; Optical noise; Optical scattering; Optical sensors; PHEMTs;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.734581
  • Filename
    734581