Exchange anisotropy in MBE grown MnPt/NiFe bilayers

Author

Ozaki, Y. ; Shimoyama, K. ; Kato, T. ; Iwata, S. ; Tsunashima, S.

Author_Institution

Dept. of Electron., Nagoya Univ., Japan

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2888

Lastpage

2891

Abstract

Exchange anisotropy has been investigated by torque magnetometry for MnPt(30 nm)/NiFe(5 nm) bilayers grown by the MBE method on MgO(001), SrTiO₃(001), and MgO(111) substrates. In-situ reflection high-energy electron diffraction observation and ex-situ X-ray diffraction measurements revealed that the MnPt layers have chemical order and have (100) uncompensated and (111) compensated plane parallel to the film plane, respectively for (001) and (111) substrate orientation. In MnPt/NiFe/SrTiO₃(001) torque components of unidirectional and uniaxial anisotropies have been observed, while in NiFe/MnPt/MgO(001) both the anisotropies almost disappeared and a torque curve with four fold symmetry was observed. This torque curve seems to be closely related with the crystal anisotropy of MnPt

Keywords

X-ray diffraction; exchange interactions (electron); ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic multilayers; manganese alloys; molecular beam epitaxial growth; nickel alloys; platinum alloys; reflection high energy electron diffraction; 30 nm; 5 nm; MBE grown MnPt/NiFe bilayers; MnPt(30 nm)/NiFe(5 nm) bilayers; MnPt-NiFe; X-ray diffraction; chemical order; crystal anisotropy; exchange anisotropy; reflection high-energy electron diffraction; torque curve; torque magnetometry; uniaxial anisotropies; Anisotropic magnetoresistance; Chemicals; Electrons; Magnetic anisotropy; Molecular beam epitaxial growth; Perpendicular magnetic anisotropy; Reflection; Substrates; Torque; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908618

Filename

908618