Title :
Effects of deposition process parameters on exchange coupling of α-Fe2O3/NiFe bi-layers and GMR of α-Fe 2O3/NiFe/Cu/NiFe spin valves
Author :
Bae, Seongtae ; Egelhoff, William F., Jr. ; Chen, P.J. ; Judy, Jack H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
fDate :
9/1/2000 12:00:00 AM
Abstract :
Effects of deposition process parameters on the exchange coupling of α-Fe2O3/NiFe bi-layers and GMR characteristics of α-Fe2O3/NiFe/Cu/NiFe spin-valves using optimized anti-ferromagnetic α-Fe2O 3 layer have been investigated. The exchange bias field was increased in α-Fe2O3(50 nm)/NiFe (7 nm) bi-layers by increasing oxygen partial pressure to 14.7%, substrate bias to 125 V, and input sputtering power up to 800 W of RF reactively sputtered α-Fe2O3 films. The thickness of NiFe and α-Fe2O3 layers also had an influence on the exchange coupling characteristics. By decreasing NiFe thickness from 35 nm to 5 nm and increasing α-Fe2O3 thickness from 550 nm, the exchange bias field dramatically increased up to 62.5 Oe. However, in the α-Fe2O3 thickness range of 50-100 nm, the exchange bias field decreased from 62.5 to 21.5 Oe. The GMR performance of as-deposited Si/α-Fe2O3(50 nm)/NiFe(3.25 nm)/Cu(2 nm)/NiFe(3.25 nm)/Au (5.4 nm) spin valve structures was characterized. The CMR ratio and MR sensitivity was 5.2% and 0.6%/0e, respectively
Keywords :
colossal magnetoresistance; exchange interactions (electron); iron alloys; iron compounds; magnetic multilayers; nickel alloys; spin valves; sputtered coatings; α-Fe2O3/NiFe bi-layers; α-Fe2O3/NiFe/Cu/NiFe spin valves; 125 V; 35 to 5 nm; 5 to 100 nm; 50 nm; 7 nm; 800 W; CMR ratio; Fe2O3-NiFe; Fe2O3-NiFe-Cu; GMR; colossal magnetoresistance; deposition process parameters; exchange bias field; exchange coupling; exchange coupling characteristics; spin valve structures; Antiferromagnetic materials; Argon; Conductivity; Giant magnetoresistance; Magnetic field measurement; Magnetic films; Magnetic materials; Radio frequency; Spin valves; Sputtering;
Journal_Title :
Magnetics, IEEE Transactions on