• DocumentCode
    1448883
  • Title

    Nested Digital Background Calibration of a 12-bit Pipelined ADC Without an Input SHA

  • Author

    Wang, Haoyue ; Wang, Xiaoyue ; Hurst, Paul J. ; Lewis, Stephen H.

  • Author_Institution
    Univ. of California, Davis, CA, USA
  • Volume
    44
  • Issue
    10
  • fYear
    2009
  • Firstpage
    2780
  • Lastpage
    2789
  • Abstract
    To reduce power dissipation, the input sample-and-hold amplifier (SHA) is eliminated in a pipelined analog-to-digital converter (ADC) with nested background calibration. The nested architecture calibrates the pipelined ADC with an algorithmic ADC that is also calibrated. Without an input SHA, a timing difference between the sampling instants of the two ADCs creates an error that interferes with calibration of the pipelined ADC. This problem is overcome with digital background timing compensation. It uses a differentiator with fixed coefficients to build an adaptive interpolator. With a 58-kHz sinusoidal input, the 12-bit 20-Msample/s pipelined ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 70.2 dB, a spurious-free dynamic range (SFDR) of 80.3 dB, and an integral nonlinearity (INL) of 0.75 least significant bit (LSB). With a 9-MHz input, the SNDR is 64.2 dB, and the SFDR is 78.3 dB. About 2 million samples or 0.1 s are required for convergence. The prototype occupies 7.5 mm2 in 0.35-mum CMOS and dissipates 231 mW from 3.3 V, which is 23 mW less than in a previous prototype with the input SHA.
  • Keywords
    amplifiers; analogue-digital conversion; calibration; CMOS; digital background timing compensation; fixed coefficients; frequency 58 kHz; frequency 9 MHz; integral nonlinearity; least significant bit; nested digital background calibration; pipelined analog-to-digital converter; power 231 mW; sample-and-hold amplifier; signal-to-noise-and-distortion ratio; size 0.35 mum; spurious-free dynamic range; time 0.1 s; voltage 3.3 V; Calibration; Error correction; Linearity; Operational amplifiers; Power amplifiers; Power dissipation; Prototypes; Sampling methods; Semiconductor device noise; Timing; Analog-to-digital conversion; CMOS analog integrated circuits; digital background calibration; nested calibration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2028756
  • Filename
    5256967