Title :
Improvement of crystallinity and magnetic characteristics of ferromagnetic-Co77Cr20Ta3 /paramagnetic-Co65Cr35 bilayered films
Author :
Sato, Atsushi ; Nakagawa, Shigeki ; Naoe, Masahiko
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
fDate :
9/1/2000 12:00:00 AM
Abstract :
In order to improve the crystallographic and magnetic characteristics of Co-Cr-Ta recording layers, optimization of the substrate temperature Ts for the seed layers was investigated. Crystalline orientation and magnetic characteristics of the ferromagnetic-Co77Cr20Ta3 layers were improved by adjusting Ts of the paramagnetic-Co65 Cr35 seed layer in the range of 150-200°C. It was found that deposition of the seed layer with excellent c-axis orientation is effective to enhance the perpendicular magnetic anisotropy and to prepare an ultrathin ferromagnetic recording layer. T s-optimized deposition of the seed layers will be useful for fabricating perpendicular magnetic recording media
Keywords :
chromium alloys; cobalt alloys; crystal structure; ferromagnetic materials; interface magnetism; magnetic thin films; paramagnetic materials; perpendicular magnetic anisotropy; perpendicular magnetic recording; tantalum alloys; 150 to 200 C; Co65Cr35; Co77Cr20Ta3; c-axis orientation; crystallinity; ferromagnetic-Co77Cr20Ta3 /paramagnetic-Co65Cr35 bilayered films; magnetic characteristics; perpendicular magnetic anisotropy; perpendicular magnetic recording media; recording layers; seed layers; substrate temperature; ultrathin ferromagnetic recording layer; Chromium; Crystallization; Magnetic anisotropy; Magnetic films; Paramagnetic materials; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; Temperature; X-ray scattering;
Journal_Title :
Magnetics, IEEE Transactions on
