• DocumentCode
    1448939
  • Title

    A Low-Noise Wideband Digital Phase-Locked Loop Based on a Coarse–Fine Time-to-Digital Converter With Subpicosecond Resolution

  • Author

    Lee, Minjae ; Heidari, Mohammad E. ; Abidi, Asad A.

  • Author_Institution
    Agilent Technol., Santa Clara, CA, USA
  • Volume
    44
  • Issue
    10
  • fYear
    2009
  • Firstpage
    2808
  • Lastpage
    2816
  • Abstract
    This paper presents the design of a digital PLL which uses a high-resolution time-to-digital converter (TDC) for wide loop bandwidth. The TDC uses a time amplification technique to reduce the quantization noise down to less than 1 ps root mean square (RMS). Additionally TDC input commutation reduces low-frequency spurs due to inaccurate TDC scaling factor in a counter-assisted digital PLL. The loop bandwidth is set to 400 kHz with a 25 MHz reference. The in-band phase noise contribution from the TDC is -116 dBc/Hz, the phase noise is -117 dBc/Hz at high band (1.8 GHz band) 400 kHz offset, and the RMS phase error is 0.3deg.
  • Keywords
    digital phase locked loops; mean square error methods; coarse-fine time-to-digital converter; digital PLL; frequency 1.8 GHz; frequency 25 MHz; frequency 400 kHz; low-noise wideband digital phase-locked loop; root mean square; subpicosecond resolution; wide loop bandwidth; Bandwidth; Frequency conversion; Noise cancellation; Oscillators; Phase detection; Phase locked loops; Phase noise; Quantization; Root mean square; Wideband; Coarse-fine architecture; digital phase-locked loop; time amplifier; time-to-digital converter (TDC); wideband modulation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2028753
  • Filename
    5256976