Title :
A Low-Noise Wideband Digital Phase-Locked Loop Based on a Coarse–Fine Time-to-Digital Converter With Subpicosecond Resolution
Author :
Lee, Minjae ; Heidari, Mohammad E. ; Abidi, Asad A.
Author_Institution :
Agilent Technol., Santa Clara, CA, USA
Abstract :
This paper presents the design of a digital PLL which uses a high-resolution time-to-digital converter (TDC) for wide loop bandwidth. The TDC uses a time amplification technique to reduce the quantization noise down to less than 1 ps root mean square (RMS). Additionally TDC input commutation reduces low-frequency spurs due to inaccurate TDC scaling factor in a counter-assisted digital PLL. The loop bandwidth is set to 400 kHz with a 25 MHz reference. The in-band phase noise contribution from the TDC is -116 dBc/Hz, the phase noise is -117 dBc/Hz at high band (1.8 GHz band) 400 kHz offset, and the RMS phase error is 0.3deg.
Keywords :
digital phase locked loops; mean square error methods; coarse-fine time-to-digital converter; digital PLL; frequency 1.8 GHz; frequency 25 MHz; frequency 400 kHz; low-noise wideband digital phase-locked loop; root mean square; subpicosecond resolution; wide loop bandwidth; Bandwidth; Frequency conversion; Noise cancellation; Oscillators; Phase detection; Phase locked loops; Phase noise; Quantization; Root mean square; Wideband; Coarse-fine architecture; digital phase-locked loop; time amplifier; time-to-digital converter (TDC); wideband modulation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2028753