Title :
New clock-feedthrough compensation scheme for switched-current circuits
Author :
Min, Byung-Moo ; Kim, Soo-Won
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
fDate :
11/1/1998 12:00:00 AM
Abstract :
An improved clock-feedthrough compensation scheme for switched current system is proposed. Both the signal dependent and the constant clock-feedthrough terms are canceled by using both nMOS and pMOS current samplers and by adopting a source replication technique. The proposed current memory cell was fabricated with 0.6 μm CMOS process. Both experimental and theoretical results on clock-feedthrough error reveal substantial reduction over the existing compensation schemes
Keywords :
CMOS analogue integrated circuits; analogue processing circuits; analogue storage; error compensation; sampled data circuits; switched current circuits; timing; 0.6 micron; CMOS process; SI circuits; clock-feedthrough compensation scheme; clock-feedthrough error; constant clock-feedthrough terms; current memory cell; nMOS current samplers; pMOS current samplers; signal dependent terms; source replication technique; switched-current circuits; CMOS process; CMOS technology; Capacitance; Clocks; MOS devices; Sampled data systems; Signal processing; Switches; Switching circuits; Voltage;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on