In-plane anisotropy in arrays of magnetic ellipses

Author

Hao, Y. ; Walsh, M. ; Farhoud, M. ; Ross, C.A. ; Smith, Henry I. ; Wang, J.Q. ; Malkinski, L.

Author_Institution

Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA

Volume

36

Issue

5

fYear

2000

fDate

9/1/2000 12:00:00 AM

Firstpage

2996

Lastpage

2998

Abstract

Large area samples of submicron arrays of elliptical thin Co dots were fabricated using interference lithography and ion milling. The magnetic properties were investigated by MFM and hysteresis loops were measured at different temperatures. The temperature dependence of coercivity was measured suggests that the thermal fluctuation plays an important role in the magnetization reversal mechanism

Keywords

arrays; cobalt; coercive force; ferromagnetic materials; magnetic anisotropy; magnetic force microscopy; magnetic hysteresis; magnetic particles; magnetisation reversal; nanostructured materials; nanotechnology; photolithography; sputter etching; Co; MFM; arrays; coercivity; elliptical thin Co dots; hysteresis loops; in-plane anisotropy; interference lithography; ion milling; large area samples; magnetic ellipses; magnetic properties; magnetization reversal mechanism; submicron array; temperature dependence; thermal fluctuation; Anisotropic magnetoresistance; Interference; Lithography; Magnetic anisotropy; Magnetic force microscopy; Magnetic hysteresis; Magnetic properties; Milling; Perpendicular magnetic anisotropy; Temperature measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.908653

Filename

908653