• DocumentCode
    1449231
  • Title

    A Cost Analysis of Systems Subject to Random Field Environments and Reliability

  • Author

    Sgarbossa, Fabio ; Pham, Hoang

  • Author_Institution
    Dept. of Manage. & Ind. Syst., Univ. of Padova, Padova, Italy
  • Volume
    40
  • Issue
    4
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    429
  • Lastpage
    437
  • Abstract
    We present a generalized cost model subject to random field environments with considerations of cost to remove failures during testing and warranty periods, and penalty cost due to the system failures. We also determine the optimal release time policies that minimize the expected system cost. Many scientific contributions have been developed in software reliability modeling, while none has studied the manufacturing or industrial system reliability growth yet, considering also the differences between testing and operating environments. The application of the proposed model, in comparison to the nonhomogenous Poisson process Goel-Okumoto model, to an industrial application is discussed to illustrate how the proposed model can be used in practice.
  • Keywords
    Weibull distribution; manufacturing systems; reliability theory; stochastic processes; Goel-Okumoto model; cost analysis; industrial system reliability; manufacturing system reliability; nonhomogenous Poisson process; optimal release time policies; random field environment; random field reliability; software reliability modeling; Field random environments; nonhomogeneous Poisson process (NHPP); optimal release time; reliability growth; system reliability; testing environments;
  • fLanguage
    English
  • Journal_Title
    Systems, Man, and Cybernetics, Part C: Applications and Reviews, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1094-6977
  • Type

    jour

  • DOI
    10.1109/TSMCC.2010.2042713
  • Filename
    5437299