Refractive Index Measurement by Using an Optoelectronic Oscillator

Author

Nguyen, Lam Duy ; Nakatani, Keitaro ; Journet, Bernard

Author_Institution

SATIE Lab., ENS Cachan, Cachan, France

Volume

22

Issue

12

fYear

2010

fDate

6/15/2010 12:00:00 AM

Firstpage

857

Lastpage

859

Abstract

The purpose of this letter is to present a preliminary experiment, showing that an optoelectronic oscillator can be used for measuring refractive index by detecting the change of the oscillation frequency. The uncertainty of the measurement is of about 10^-2. However, this value can decrease to 10^-3 or less if the mechanic vibrations, the temperature control of liquid, and the long-term stability of the oscillator are improved. Measurements have been performed for acetonitrile, acetone, dioxane, and chloroform at the wavelength of 1535 nm and at 25°C approximately.

Keywords

integrated optoelectronics; optoelectronic devices; oscillators; refractive index measurement; temperature control; vibrations; acetone; acetonitrile; chloroform; liquid temperature control; long-term stability; mechanic vibrations; optoelectronic oscillator; oscillation frequency; refractive index measurement; temperature 25 degC; wavelength 1353 nm; Free spectral range (FSR); optoelectronic oscillator (OEO); phase noise; refractive index;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2010.2046028

Filename

5437335